DMOZ Internet Directory : Science : Methods_and_Techniques : Microscopy : Scanning_Probe

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These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).

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Scanning Tunneling Microscopy - Image gallery of metal surfaces, generated at the IBM Almaden Research Center in San Jose, CA. SPM Application - Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University. Imaging Surfaces on a Fine Scale - Description of techniques and applications. Conference on Non-Contact AFM - August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation. University of Leuven, Belgium - The SPM Group - Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links. ALB's Webpage - Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra. Modern Research and Educational Topics in Microscopy - Online edition of this book edited by A Mendez-Vilas and J Diaz.

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